详情

原文传递 Vehicle Classification from Single Loop Detectors.

题名：	Vehicle Classification from Single Loop Detectors.
作者：	coifman, b.
关键词：	vehicle detection, freeways, traffic monitoring, traffic surveillance, traffic data, methodology
摘要：	Vehicle classification data are important inputs for pavement maintenance, traffic modeling, and emission evaluation. Various technologies including weight-in-motion (WIM), axle counting with piezo-electric sensors or length measurement from dual loop detectors have been used for vehicle classification. This research extends length based vehicle classification to single loop detectors. It promises a lower cost alternative as well as the potential to use existing detectors already deployed for freeway management. Of course the single loop based estimates could also be easily incorporated in a more sophisticated classification station as an independent validation of its measurements. The main challenge with single loop detector based length based classification comes from accurately estimating speed and thus, length. In this study we develop a methodology to make such accurate speed and length estimates and then use the latter to classify vehicles based on length. Performance is validated against two sources of independent ground truth data with results that approach the accuracy of dual loop detectors. In the process of generating ground truth data a few previously unknown, sight specific problems with existing vehicle classification and detection stations were found and diagnosed, e.g., pulse break-up, as discussed herein. / NOTE: Final rept. 1 Mar 05-30 Jun 07. / Supplementary Notes: Prepared in cooperation with Ohio State Univ., Columbus. Civil and Environmental Engineering and Geodetic Science. Sponsored by Department of Transportation, Washington, DC. Research and Special Programs Administration. / Availability Note: Order this product from NTIS by: phone at 1-800-553-NTIS (U.S. customers); (703)605-6000 (other countries); fax at (703)605-6900; and email at orders@ntis.gov. NTIS is located at 5285 Port Royal Road, Springfield, VA, 22161, USA.
总页数：	u0723；62p
报告类型：	科技报告