题名: |
Passive Badge Assessment for Long-Term, Low-Level Air Monitoring on Submarines: VOC Badge Validation. |
作者: |
williams, k. p. rose-pehrsson, s. l. kidwell, d. a. |
关键词: |
benzene, low level, reproducibility, indoor air pollution, toluenes, gas detectors, concentration(chemistry), xylenes, tables(data), long range(time), exposure(general), gas analysis, test methods, passive systems |
摘要: |
Passive badge monitors for benzene, toluene, and xylene detection (cumulatively) were tested for analyte-specific air analysis onboard U.S. Navy (USN) nuclear submarines. Long-term sampling efficiency was evaluated for a 28- day period by comparing the response of the passive badge to an active tube sampling method. The badges and tubes were exposed to benzene, toluene, and xylene vapors at concentrations ranging from 0.33 to 1.98 ppm, resulting in time-weighted-average exposures ranging from 47-283 ppb. High-and low-level concentrations were tested to examine the response range of the badge. The badges continued to accumulate the analyte for 28 days, with no change in sampling rate over time. Badge results appeared to be stable and consistent, but were different than the results observed from tubes. Accumulation of benzene onto badges was consistently higher than accumulation onto tubes (+24%), while the badge response to toluene and xylene was lower than that of the tubes (-40%, -49%). A correction factor may need to be applied to the analytical results to obtain more accurate, quantitative data. Appendixes include raw data in table form for active sampling tubes and passive sampling badges; tube/badge comparisons at high-level and low-level exposures; and tube/badge comparisons (replacement badges) at high-level and low-level exposures. / NOTE: Final rept. Jun-Aug 2006. / Supplementary Notes: Prepared in cooperation with Nova Research, Inc., Alexandria, VA. The original document contains color images. / Availability Note: Product reproduced from digital image. Order this product from NTIS by: phone at 1-800-553-NTIS (U.S. customers); (703)605-6000 (other countries); fax at (703)605-6900; and email at orders@ntis.gov. NTIS is located at 5285 Port Royal Road, Springfield, VA, 22161, USA. |
总页数: |
u0711;23p |
报告类型: |
科技报告 |