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Background X-ray Spectrum of Radioactive Samples
| 题名： | Background X-ray Spectrum of Radioactive Samples |
| 作者： | Dawn E. Janney;Shannon Yee; |
| 关键词： | Radioactive materials; Scanning electron microscopy; X-ray spectroscopy37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; 36 MATERIALS SCIENCE; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; BETA PARTICLES; BREMSSTRAHLUNG; DECAY; ELECTRON MICROSCOPES; INTERNAL CONVERSION; NUCLEAR FUELS; RADIATIONS; RADIOACTIVE MATERIALS; RADIOACTIVITY; X-RAY SPECTROMETERS |
| 摘要： | An energy-dispersive X-ray spectrometer (EDS) is commonly used with a scanning electron microscope (SEM) to analyze the elemental compositions and microstructures of a variety of samples. For example, the microstructures of nuclear fuels are commonly investigated with this technique. However, the radioactivity of some materials introduces additional X-rays that contribute to the EDS background spectrum. These X-rays are generally not accounted for in spectral analysis software, and can cause misleading results. X-rays from internal conversion [1], Bremsstrahlung [2] radiation associated with alpha ionizations and beta particle interactions [3], and gamma rays from radioactive decay can all elevate the background of radioactive materials. |
| 报告类型： | 科技报告 |
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