原文传递
Surface roughness due to residual ice in the use of low power deicing systems
| 题名： | Surface roughness due to residual ice in the use of low power deicing systems |
| 作者： | Shin, Jaiwon; Bond, Thomas H. |
| 关键词： | surface；systems；power；rough；dual；distributed；protection；different；information；tunnel |
| 摘要： | Thicknesses of residual ice are presented to provide information on surface contamination and associated roughness during deicing events. Data was obtained from low power ice protection systems tests conducted in the Icing Research Tunnel at NASA Lewis Research Center (LeRC) with nine different deicing systems. Results show that roughness associated with residual ice is not characterized by uniformly distributed roughness. Results also show that deicing systems require a critical mass of ice to generate a sufficient expelling force to remove the ice. |
| 报告类型： | 科技报告 |
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