题名: | Radio Frequency-Based Microcontroller Anomaly Detection. |
作者: | Wylie, J. P. |
关键词: | Correlation, Magnetic anomaly detection, Cryptography, Embedded systems, Unintentional emissions, Anomaly detection, Microcontroller, Aes(advanced encryption standard) |
摘要: | The research presented here focuses on applying the Correlation-Based Anomaly Detection (CBAD) process to a Microcontroller Unit (MCU) as a means of detecting an anomalous behavior by verifying that the device is behaving normally. This research utilizes a previously developed method to collect Unintentional Radio Frequency (RF) Emissions(UREs) Texas Instruments MSP430F5529 microcontrollers. Once captured, the time domain signals are processed and used as one of two inputs into the CBAD algorithm, which generates a statistic to be compared to a threshold. Like-device performance met the arbitrary benchmark of Equal Error Rate (EER) 10 . Cross-device performance met the benchmark when the reference signal originated from the same manufacturing lot, but did not meet the benchmark when the reference signal originated from a different manufacturing lot. |
报告类型: | 科技报告 |