题名: |
Physics and Chemistry of Graphene-Functional Oxide Interfaces. |
作者: |
Dougherty, D.; Rowe, J. E.; Ulrich, M. S. |
关键词: |
Calibration, Graphene, Oxide films, Spectrometers, Ultrafast laser spectroscopy, Band structures, Graphene-functional oxide interfaces, Electronic structure characterization tools, 2ppe (two photon photoemission spectroscopy), Arpes (angle resolved photoemission spectroscopy), Electron spectrometers |
摘要: |
In the final project period, research efforts were re-directed to the installation and calibration of an advanced electronic structure and dynamics characterization facility aimed at 2D materials and complex oxide films. This materials focus is a natural extension of the earlier project work integrating graphene with magnetic oxides. It pushes research in a direction that is more broad than the original scope of the project but that address similar advanced materials needs relevant to Army interests in computing, information processing, and sensing. |
报告类型: |
科技报告 |